Dynamic intensity normalization using eigen flat fields in X-ray imaging
dc.contributor.author
Nieuwenhove, Vincent van
dc.contributor.author
Beenhouwer, Jan de
dc.contributor.author
Carlo, Francesco de
dc.contributor.author
Mancini, Lucia
dc.contributor.author
Marone, Federica
dc.contributor.author
Sijbers, Jan
dc.date.accessioned
2017-06-11T23:16:50Z
dc.date.available
2017-06-11T23:16:50Z
dc.date.issued
2015-10
dc.identifier.issn
1094-4087
dc.identifier.other
10.1364/OE.23.027975
dc.identifier.uri
http://hdl.handle.net/20.500.11850/110715
dc.language.iso
en
dc.publisher
Optical Society of America
dc.title
Dynamic intensity normalization using eigen flat fields in X-ray imaging
dc.type
Journal Article
ethz.journal.title
Optics Express
ethz.journal.volume
23
ethz.journal.issue
21
ethz.journal.abbreviated
Opt. Express
ethz.pages.start
27975
ethz.pages.end
27989
ethz.notes
Published online 15 October 2015.
ethz.identifier.nebis
001934332
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03817 - Stampanoni, Marco F.M. / Stampanoni, Marco F.M.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03817 - Stampanoni, Marco F.M. / Stampanoni, Marco F.M.
ethz.date.deposited
2017-06-11T23:17:26Z
ethz.source
ECIT
ethz.identifier.importid
imp593653f90c47619588
ethz.ecitpid
pub:171963
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T13:31:35Z
ethz.rosetta.lastUpdated
2023-02-06T13:13:08Z
ethz.rosetta.versionExported
true
ethz.COinS
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