Temperature Variation Aware Multi-Scale Delay, Power and Thermal Analysis at RT and Gate Level
Publication status
publishedExternal links
Journal / series
Integration: the VLSI JournalVolume
Pages / Article No.
Publisher
ElsevierSubject
Integrated circuits; Multi-scale analysis; Thermal simulation; Temperature variation; Delay/power estimationOrganisational unit
03996 - Benini, Luca / Benini, Luca
Notes
Received 15 November 2013, Revised 19 October 2014, Accepted 20 October 2014, Published online 20 November 2014.More
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