Temperature Variation Aware Multi-Scale Delay, Power and Thermal Analysis at RT and Gate Level
- Journal Article
Journal / seriesIntegration: the VLSI Journal
Pages / Article No.
SubjectIntegrated circuits; Multi-scale analysis; Thermal simulation; Temperature variation; Delay/power estimation
Organisational unit03996 - Benini, Luca
NotesReceived 15 November 2013, Revised 19 October 2014, Accepted 20 October 2014, Published online 20 November 2014.
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