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dc.contributor.author
Ammari, Habib
dc.contributor.author
Lee, Eunjung
dc.contributor.author
Kwon, Hyeuknam
dc.contributor.author
Seo, Jin Keun
dc.contributor.author
Woo, Eung Je
dc.date.accessioned
2017-06-11T23:27:46Z
dc.date.available
2017-06-11T23:27:46Z
dc.date.issued
2015-05
dc.identifier.issn
0036-1399
dc.identifier.issn
1095-712X
dc.identifier.other
10.1137/140964618
dc.identifier.uri
http://hdl.handle.net/20.500.11850/111159
dc.language.iso
en
dc.publisher
SIAM
dc.subject
Electrical impedance tomography
dc.subject
Mechanical vibration
dc.subject
Medical imaging
dc.subject
Anomaly detection
dc.title
Mathematical modeling of mechanical vibration-assisted conductivity imaging
dc.type
Journal Article
ethz.journal.title
SIAM J. Appl. Math.
ethz.journal.volume
75
ethz.journal.issue
3
ethz.pages.start
1031
ethz.pages.end
1046
ethz.notes
Published online 21 May 2015.
ethz.identifier.nebis
000016405
ethz.publication.place
Philadelphia, PA
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02000 - Dep. Mathematik / Dep. of Mathematics::02501 - Seminar für Angewandte Mathematik / Seminar for Applied Mathematics::09504 - Ammari, Habib / Ammari, Habib
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02000 - Dep. Mathematik / Dep. of Mathematics::02501 - Seminar für Angewandte Mathematik / Seminar for Applied Mathematics::09504 - Ammari, Habib / Ammari, Habib
ethz.date.deposited
2017-06-11T23:27:59Z
ethz.source
ECIT
ethz.identifier.importid
imp59365400af4a418481
ethz.ecitpid
pub:172510
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T10:50:55Z
ethz.rosetta.lastUpdated
2018-11-02T21:47:30Z
ethz.rosetta.versionExported
true
ethz.COinS
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