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dc.contributor.author
Binnig, Carsten
dc.contributor.author
Kossmann, Donald
dc.contributor.author
Lo, Eric
dc.date.accessioned
2017-06-08T20:10:33Z
dc.date.available
2017-06-08T20:10:33Z
dc.date.issued
2008
dc.identifier.uri
http://hdl.handle.net/20.500.11850/11162
dc.language.iso
en
dc.publisher
IEEE Computer Society
dc.title
Towards Automatic Test Database Generation
dc.type
Journal Article
ethz.journal.title
Bulletin of the Technical Committee on Data Engineering
ethz.journal.volume
31
ethz.journal.issue
1
ethz.pages.start
28
ethz.pages.end
35
ethz.notes
.
ethz.publication.place
Washington, D.C.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02663 - Institut für Computing Platforms / Institute for Computing Platforms::03689 - Kossmann, Donald (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02663 - Institut für Computing Platforms / Institute for Computing Platforms::03689 - Kossmann, Donald (ehemalig)
ethz.identifier.url
http://sites.computer.org/debull/A08mar/binnig.pdf
ethz.date.deposited
2017-06-08T20:10:47Z
ethz.source
ECIT
ethz.identifier.importid
imp59364bfe9b2bf96167
ethz.ecitpid
pub:22291
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T07:25:15Z
ethz.rosetta.lastUpdated
2018-10-01T06:03:12Z
ethz.rosetta.versionExported
true
ethz.COinS
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