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dc.contributor.author
Ciupa, Ilinca
dc.contributor.author
Meyer, Bertrand
dc.contributor.author
Oriol, Manuel
dc.contributor.author
Pretschner, Alexander
dc.date.accessioned
2017-06-08T20:12:28Z
dc.date.available
2017-06-08T20:12:28Z
dc.date.issued
2008
dc.identifier.isbn
978-0-7695-3405-3
dc.identifier.other
10.1109/ISSRE.2008.18
dc.identifier.uri
http://hdl.handle.net/20.500.11850/11266
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Empirical studies
dc.subject
Fault classification
dc.subject
Object oriented software
dc.subject
Testing strategies
dc.title
Finding Faults
dc.type
Conference Paper
ethz.title.subtitle
Manual Testing vs. Random+ Testing vs. User Reports
ethz.book.title
Software Reliability Engineering, 2008. ISSRE 2008. 19th International Symposium on
ethz.pages.start
157
ethz.pages.end
166
ethz.event
19th International Symposium on Software Reliability Engineering
ethz.event.location
Seattle, WA, USA
ethz.event.date
November 11-14, 2008
ethz.notes
Publication Date: 10-14 Nov. 2008, Current Version Published: 2008-12-08.
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02660 - Institut für Informationssicherheit / Institute of Information Security::03634 - Basin, David / Basin, David
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02150 - Dep. Informatik / Dep. of Computer Science::02660 - Institut für Informationssicherheit / Institute of Information Security::03634 - Basin, David / Basin, David
ethz.date.deposited
2017-06-08T20:12:40Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c006ef7048896
ethz.ecitpid
pub:22405
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T15:31:25Z
ethz.rosetta.lastUpdated
2022-03-28T08:00:17Z
ethz.rosetta.versionExported
true
ethz.COinS
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