Photocurrent spectroscopy and X-ray microdiffraction study of highly strained germanium nanostructures

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Author
Sigg, Hans
Faist, Jérômecc
Guilloy, Kevin
Pauc, Nicolas
Gassenq, Alban
Gentile, Pascal
Tardif, Samuel
Rieutord, François
Escalante, Jose M.
Duchemin, Ivan
Niquet, Yann M.
Calvo, Vincent
Dias, G. Osvaldo
Rouchon, Denis
Widiez, Julie
Hartmann, Jean M.
Fowler, Daivid R.
Chelnokov, Alexei V.
Reboud, Vincent
Geiger, Richard
Zabel, Thomas
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Date
2015
Type
    Conference Paper
Publication status
published
External links
Book title
2015 IEEE 12th International Conference on Group IV Photonics (GFP)
Pages / Article No.
173 - 174
Publisher
IEEE
Event
12th IEEE International Conference on Group IV Photonics (GFP 2015), Vancouver, Canada, August 26-28, 2015
Organisational unit
03759 - Faist, Jérôme / Faist, Jérôme  
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Citations
Cited 2 times in Scopus
ETH Bibliography
yes
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