Photocurrent spectroscopy and X-ray microdiffraction study of highly strained germanium nanostructures

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Autor(in)
Sigg, Hans
Faist, Jérômecc
Guilloy, Kevin
Pauc, Nicolas
Gassenq, Alban
Gentile, Pascal
Tardif, Samuel
Rieutord, François
Escalante, Jose M.
Duchemin, Ivan
Niquet, Yann M.
Calvo, Vincent
Dias, G. Osvaldo
Rouchon, Denis
Widiez, Julie
Hartmann, Jean M.
Fowler, Daivid R.
Chelnokov, Alexei V.
Reboud, Vincent
Geiger, Richard
Zabel, Thomas
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Datum
2015
Typ
    Conference Paper
Publikationsstatus
published
Externe Links
Buchtitel
2015 IEEE 12th International Conference on Group IV Photonics (GFP)
Seiten / Artikelnummer
173 - 174
Verlag
IEEE
Konferenz
12th IEEE International Conference on Group IV Photonics (GFP 2015), Vancouver, Canada, August 26-28, 2015
Organisationseinheit
03759 - Faist, Jérôme / Faist, Jérôme  
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2 Zitate in Scopus
ETH Bibliographie
yes
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