Photocurrent spectroscopy and X-ray microdiffraction study of highly strained germanium nanostructures
dc.contributor.author
Sigg, Hans
dc.contributor.author
Faist, Jérôme
dc.contributor.author
Guilloy, Kevin
dc.contributor.author
Pauc, Nicolas
dc.contributor.author
Gassenq, Alban
dc.contributor.author
Gentile, Pascal
dc.contributor.author
Tardif, Samuel
dc.contributor.author
Rieutord, François
dc.contributor.author
Escalante, Jose M.
dc.contributor.author
Duchemin, Ivan
dc.contributor.author
Niquet, Yann M.
dc.contributor.author
Calvo, Vincent
dc.contributor.author
Dias, G. Osvaldo
dc.contributor.author
Rouchon, Denis
dc.contributor.author
Widiez, Julie
dc.contributor.author
Hartmann, Jean M.
dc.contributor.author
Fowler, Daivid R.
dc.contributor.author
Chelnokov, Alexei V.
dc.contributor.author
Reboud, Vincent
dc.contributor.author
Geiger, Richard
dc.contributor.author
Zabel, Thomas
dc.date.accessioned
2018-05-04T09:29:07Z
dc.date.available
2017-06-12T00:26:04Z
dc.date.available
2018-05-04T09:29:07Z
dc.date.issued
2015
dc.identifier.isbn
978-1-4799-8255-4
en_US
dc.identifier.isbn
978-1-4799-8254-7
en_US
dc.identifier.other
10.1109/Group4.2015.7305919
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/112697
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Photocurrent spectroscopy and X-ray microdiffraction study of highly strained germanium nanostructures
en_US
dc.type
Conference Paper
dc.date.published
2015-10-26
ethz.book.title
2015 IEEE 12th International Conference on Group IV Photonics (GFP)
en_US
ethz.pages.start
173
en_US
ethz.pages.end
174
en_US
ethz.event
12th IEEE International Conference on Group IV Photonics (GFP 2015)
en_US
ethz.event.location
Vancouver, Canada
en_US
ethz.event.date
August 26-28, 2015
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
en_US
ethz.date.deposited
2017-06-12T00:29:55Z
ethz.source
ECIT
ethz.identifier.importid
imp593654188f5af39226
ethz.ecitpid
pub:174289
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-13T00:00:51Z
ethz.rosetta.lastUpdated
2022-03-28T20:00:53Z
ethz.rosetta.versionExported
true
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