Nanochemical surface analyzer in CMOS technology

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Author

Date

2001

Type

Other Conference Item

ETH Bibliography

yes

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Publication status

unpublished

Event

3rd International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Makuhari, Chiba, Japan, May 27-31, 2001

Organisational unit

03684 - Hierlemann, Andreas / Hierlemann, Andreas

Notes

See also: http://e-citations.ethbib.ethz.ch/view/pub:172008.

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ETH Bibliography

yes

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Research Collection