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dc.contributor.author
Iannuzzo, Francesco
dc.contributor.author
Ciappa, Mauro
dc.date.accessioned
2017-06-12T01:09:56Z
dc.date.available
2017-06-12T01:09:56Z
dc.date.issued
2016-03
dc.identifier.issn
0026-2714
dc.identifier.issn
1872-941X
dc.identifier.other
10.1016/j.microrel.2016.01.012
dc.identifier.uri
http://hdl.handle.net/20.500.11850/113188
dc.language.iso
en
dc.publisher
Elsevier
dc.title
Guest Editorial. Reliability Issues in Power Electronics
dc.type
Other Journal Item
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
58
ethz.journal.abbreviated
Microelectron. reliab.
ethz.pages.start
1
ethz.pages.end
2
ethz.notes
Published online 25 January 2016.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
001933457
ethz.publication.place
Kidlington
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
ethz.date.deposited
2017-06-12T01:13:57Z
ethz.source
ECIT
ethz.identifier.importid
imp593654229025988596
ethz.ecitpid
pub:174854
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T13:30:19Z
ethz.rosetta.lastUpdated
2020-02-14T16:29:50Z
ethz.rosetta.versionExported
true
ethz.COinS
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