Identifying Layers in Random Multiphase Structures

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Author
Mader, Kevin
Stampanoni, Marco
Date
2016
Type
  • Conference Paper
Publication status
published
External links
Full text via SFX
Editor
Jonge, Martin D. de
Paterson, David J.
Ryan, Christopher G.
Book title
Proceedings of the 12th International Conference on X-Ray Microscopy (XRM 2014)
Journal / series
AIP Conference Proceedings
Volume
1696
Pages
020046
Publisher
AIP Publishing
Event
12th International Conference on X-Ray Microscopy, XRM 2014, Melbourne, Australia, October 26–31, 2014
Subject
X-ray imaging; X-ray microscopy; K-means; Morphology; 3D analysis; 3D structure
Notes
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