Scale-Aware Alignment of Hierarchical Image Segmentation
Metadata only
Date
2016Type
- Conference Paper
ETH Bibliography
yes
Altmetrics
Publication status
publishedExternal links
Search via SFX
Book title
Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern RecognitionPages / Article No.
Publisher
IEEEEvent
Organisational unit
02652 - Institut für Bildverarbeitung / Computer Vision Laboratory03514 - Van Gool, Luc
More
Show all metadata
ETH Bibliography
yes
Altmetrics