Short-Circuit Protection Circuits for Silicon-Carbide Power Transistors

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Author
Sadik, Diane-Perle
Colmenares, Juan
Tolstoy, Georg
Peftitsis, Dimosthenis
Bakowski, Mietek
Rabkowski, Jacek
Nee, Hans-Peter
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Date
2016-04
Type
  • Journal Article
Publication status
published
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Journal / series
IEEE Transactions on Industrial Electronics
Volume
63(4)
Pages / Article No.
1995 - 2004
Publisher
IEEE
Subject
Bipolar junction transistor (BJT); Driver circuits; Failure analysis; Fault detection; Fault protection; Junction field-effect transistor (JFET); Power MOSFET; Semiconductor device reliability; Short-circuit current; Silicon carbide (SiC); Wide-bandgap semiconductors
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Citations
Cited 25 times in Web of Science
ETH Bibliography
yes
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