Short-Circuit Protection Circuits for Silicon-Carbide Power Transistors
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Date
2016-04Type
- Journal Article
Citations
Cited 95 times in
Web of Science
Cited 112 times in
Scopus
ETH Bibliography
yes
Altmetrics
Publication status
publishedExternal links
Journal / series
IEEE Transactions on Industrial ElectronicsVolume
Pages / Article No.
Publisher
IEEESubject
Bipolar junction transistor (BJT); Driver circuits; Failure analysis; Fault detection; Fault protection; Junction field-effect transistor (JFET); Power MOSFET; Semiconductor device reliability; Short-circuit current; Silicon carbide (SiC); Wide-bandgap semiconductorsMore
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Citations
Cited 95 times in
Web of Science
Cited 112 times in
Scopus
ETH Bibliography
yes
Altmetrics