High-resolution Kelvin probe force microscopy of active nanoelectronic devices

Open access
Author
Wagner, Tino
Date
2016Type
- Doctoral Thesis
ETH Bibliography
yes
Altmetrics
Permanent link
https://doi.org/10.3929/ethz-a-010615234Publication status
publishedExternal links
Search via SFX
Contributors
Examiner: Stemmer, AndreasExaminer: Gotsmann, Bernd
Publisher
ETH-ZürichSubject
ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; NANOELEKTRONIK; NANOSTRUKTURIERTE MATERIALIEN (PHYSIK DER KONDENSIERTEN MATERIE); NANOELECTRONICS; NANOSTRUCTURED MATERIALS (CONDENSED MATTER PHYSICS); RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIEOrganisational unit
02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.03444 - Stemmer, Andreas / Stemmer, Andreas
More
Show all metadata
ETH Bibliography
yes
Altmetrics