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dc.contributor.author
Wagner, Tino
dc.contributor.supervisor
Stemmer, Andreas
dc.contributor.supervisor
Gotsmann, Bernd
dc.date.accessioned
2017-12-08T14:38:33Z
dc.date.available
2017-06-12T03:37:54Z
dc.date.available
2017-12-08T14:38:33Z
dc.date.issued
2016
dc.identifier.uri
http://hdl.handle.net/20.500.11850/114810
dc.identifier.doi
10.3929/ethz-a-010615234
dc.language.iso
en
en_US
dc.publisher
ETH-Zürich
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY
en_US
dc.subject
NANOELEKTRONIK
en_US
dc.subject
NANOSTRUKTURIERTE MATERIALIEN (PHYSIK DER KONDENSIERTEN MATERIE)
en_US
dc.subject
NANOELECTRONICS
en_US
dc.subject
NANOSTRUCTURED MATERIALS (CONDENSED MATTER PHYSICS)
en_US
dc.subject
RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE
en_US
dc.title
High-resolution Kelvin probe force microscopy of active nanoelectronic devices
en_US
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2016
ethz.size
1 Band
en_US
ethz.code.ddc
6 - Technology, medicine and applied sciences::620 - Engineering & allied operations
en_US
ethz.code.ddc
5 - Science::530 - Physics
en_US
ethz.identifier.diss
23290
en_US
ethz.identifier.nebis
010615234
ethz.publication.place
Zürich
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-12T03:39:15Z
ethz.source
ECOL
ethz.source
ECIT
ethz.identifier.importid
imp59366b8b7581489663
ethz.identifier.importid
imp593654468470194603
ethz.ecolpid
eth:48887
ethz.ecitpid
pub:176615
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2017-07-15T10:06:20Z
ethz.rosetta.lastUpdated
2017-12-08T14:38:58Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=High-resolution%20Kelvin%20probe%20force%20microscopy%20of%20active%20nanoelectronic%20devices&rft.date=2016&rft.au=Wagner,%20Tino&rft.genre=unknown&rft.btitle=High-resolution%20Kelvin%20probe%20force%20microscopy%20of%20active%20nanoelectronic%20devices
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