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dc.contributor.author
Offermans, Peter
dc.contributor.author
Koenraad, Paul M.
dc.contributor.author
Wolter, Joachim H.
dc.contributor.author
Beck, Mattias
dc.contributor.author
Aellen, Thierry
dc.contributor.author
Faist, Jérôme
dc.date.accessioned
2017-06-12T04:39:40Z
dc.date.available
2017-06-12T04:39:40Z
dc.date.issued
2003-11
dc.identifier.issn
0003-6951
dc.identifier.issn
1077-3118
dc.identifier.other
10.1063/1.1627942
dc.identifier.uri
http://hdl.handle.net/20.500.11850/115435
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Digital alloy interface grading of an InAlAs/InGaAs quantum cascade laser structure studied by cross-sectional scanning tunneling microscopy
dc.type
Journal Article
ethz.journal.title
Applied Physics Letters
ethz.journal.volume
83
ethz.journal.issue
20
ethz.journal.abbreviated
Appl. phys. lett.
ethz.pages.start
4131
ethz.pages.end
4133
ethz.notes
.
ethz.identifier.nebis
000038985
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03759 - Faist, Jérôme / Faist, Jérôme
ethz.date.deposited
2017-06-12T04:46:10Z
ethz.source
ECIT
ethz.identifier.importid
imp593654534cdff64519
ethz.ecitpid
pub:177266
ethz.eth
no
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T16:03:58Z
ethz.rosetta.lastUpdated
2018-11-02T22:58:12Z
ethz.rosetta.versionExported
true
ethz.COinS
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