Cross-sectional STM on InGaAs/InAlAs laser structures

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Author
Offermans, P.
Koenraad, P.M.
Wolter, J.H.
Song, J.D.
Kim, J.M.
Bae, S.J.
Lee, Y.T.
Beck, M.
Aellen, Thierry
Faist, Jérôme
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Date
2003
Type
  • Conference Paper
Publication status
published
External links
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Editor
Cullis, A.G.
Midgley, P.A.
Book title
Microscopy of Semiconducting Materials 2003: Proceedings of the Institute of Physics Cconference, Cambridge University, 31 March-3 April 2003
Journal / series
Institute of Physics Conference Series
Volume
180
Pages / Article No.
653 - 656
Publisher
IoP
Event
Institute of Physics Conference 2003, Cambridge, England, March 31 - April 3, 2003
Organisational unit
03759 - Faist, Jérôme / Faist, Jérôme
Notes
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no
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