Cross-sectional STM on InGaAs/InAlAs laser structures

Thumbnail
Metadata only
Author
Offermans, P.
Koenraad, P.M.
Wolter, J.H.
Song, J.D.
Kim, J.M.
Bae, S.J.
Lee, Y.T.
Beck, M.
Aellen, Thierry
Faist, Jérôme
Show all
Date
2003
Type
  • Conference Paper
Publication status
published
External links
Search via SFX
Editor
Cullis, A.G.
Midgley, P.A.
Book title
Microscopy of Semiconducting Materials 2003: Proceedings of the Institute of Physics Cconference, Cambridge University, 31 March-3 April 2003
Journal / series
Institute of Physics Conference Series
Volume
180
Pages / Article No.
653 - 656
Publisher
IoP
Event
Institute of Physics Conference 2003, Cambridge, England, March 31 - April 3, 2003
Organisational unit
03759 - Faist, Jérôme
Notes
.
More
Show all metadata
ETH Bibliography
no
Altmetrics