Cross-sectional STM on InGaAs/InAlAs laser structures

Metadata only

Author

Date

2003

Type

Conference Paper

ETH Bibliography

no

Altmetrics

Publication status

published

Editor

Book title

Microscopy of Semiconducting Materials 2003: Proceedings of the Institute of Physics Cconference, Cambridge University, 31 March-3 April 2003

Journal / series

Institute of Physics Conference Series

Volume

180

Pages / Article No.

653 - 656

Publisher

IOP Publishing

Event

Institute of Physics Conference 2003, Cambridge, United Kingdom, March 31 - April 3, 2003

Organisational unit

03759 - Faist, Jérôme / Faist, Jérôme

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ETH Bibliography

no

Altmetrics

Research Collection