III-V-based hetero tunnel FETs: A simulation study with focus on non-ideality effects

Schenk, Andreas; Sant, Saurabh; Moselund, Kirsten E.; Riel, Heike E.

doi:10.1109/ULIS.2016.7440039

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Date

2016

Type

Conference Paper

Citations

Cited 17 times in Scopus

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yes

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Publication status

published

External links

https://doi.org/10.1109/ULIS.2016.7440039

Book title

Proceedings of the 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EURSOI-ULIS 2016)

Pages / Article No.

9 - 12

Publisher

IEEE

Event

2nd Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2016, Vienna, Austria, January 25-27, 2016

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Citations

Cited 17 times in Scopus

ETH Bibliography

yes

Altmetrics

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