Time-of-flight MeV-SIMS with beam induced secondary electron trigger
Metadata only
Date
2016-08Type
- Journal Article
Publication status
publishedExternal links
Journal / series
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and AtomsVolume
Pages / Article No.
Publisher
ElsevierSubject
MeV SIMS; Secondary electrons; Secondary ions; Heavy ion microbeam; Electron start; Molecular imagingOrganisational unit
08619 - Labor für Ionenstrahlphysik (LIP) / Laboratory of Ion Beam Physics (LIP)
Notes
Published online 21 May 2016.More
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