Time-of-flight MeV-SIMS with beam induced secondary electron trigger

Thumbnail
Metadata only
Author
Schulte-Borchers, Martina
Döbeli, Max
Müller, Arnold M.
George, Matthias
Synal, Hans-Arno
Show all
Date
2016-08
Type
  • Journal Article
Publication status
published
External links
Full text via SFX
Journal / series
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume
380
Pages
94 - 98
Publisher
Elsevier
Subject
MeV SIMS; Secondary electrons; Secondary ions; Heavy ion microbeam; Electron start; Molecular imaging
Organisational unit
08619 - Labor für Ionenstrahlphysik (LIP)
Notes
Published online 21 May 2016.
More
Show all metadata
Altmetrics