Time-of-flight MeV-SIMS with beam induced secondary electron trigger - Research Collection

Metadata only

Author

Schulte-Borchers, Martina

Döbeli, Max

Müller, Arnold M.

George, Matthias

Synal, Hans-Arno

Date

2016-08

Type

Journal Article

Citations

Cited 2 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1016/j.nimb.2016.05.011

Journal / series

Nuclear Instruments & Methods in Physics Research. Section B

Volume

380

Pages / Article No.

94 - 98

Publisher

Elsevier

Subject

MeV SIMS; Secondary electrons; Secondary ions; Heavy ion microbeam; Electron start; Molecular imaging

Organisational unit

08619 - Labor für Ionenstrahlphysik (LIP)

Notes

Published online 21 May 2016.

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Citations

Cited 2 times in Web of Science

ETH Bibliography

yes

Altmetrics