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dc.contributor.author
Zahner, Marco
dc.contributor.author
Fröhlich, Jürg
dc.contributor.author
Leuthold, Juerg
dc.date.accessioned
2018-05-16T15:18:46Z
dc.date.available
2017-06-12T06:50:51Z
dc.date.available
2018-05-16T15:18:46Z
dc.date.issued
2016
dc.identifier.uri
http://hdl.handle.net/20.500.11850/117007
dc.language.iso
en
en_US
dc.subject
Dosimetry (measurements)
en_US
dc.subject
ELF/LF
en_US
dc.subject
Work in Progress
en_US
dc.title
ExpoM: Exposure Measurement Platform Enabling ELF Magnetic Field and RF Electromagnetic Field Strength Measurements
en_US
dc.type
Other Conference Item
ethz.event
Joint meeting of the Bioelectromagnetics Society (BEMS) and the European BioElectromagnetics Association (EBEA), BioEM 2016
en_US
ethz.event.location
Ghent, Belgium
en_US
ethz.event.date
June 5-10, 2016
en_US
ethz.notes
Student Flash Poster Session A
en_US
ethz.publication.status
unpublished
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Electromagnetic Fields Laboratory::03974 - Leuthold, Juerg / Leuthold, Juerg
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02635 - Institut für Elektromagnetische Felder / Electromagnetic Fields Laboratory::03974 - Leuthold, Juerg / Leuthold, Juerg
ethz.date.deposited
2017-06-12T06:51:34Z
ethz.source
ECIT
ethz.identifier.importid
imp593654702826423948
ethz.ecitpid
pub:178903
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-05-16T15:18:48Z
ethz.rosetta.lastUpdated
2019-02-03T01:33:52Z
ethz.rosetta.versionExported
true
ethz.COinS
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