Frequency-modulation atomic force microscopy using a length-extension resonator: resonance frequency drift compensation and high-resolution

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Author
Beyer, Hannes
Wagner, Tino
Stemmer, Andreas
Date
2016
Type
    Other Conference Item
Publication status
unpublished
Event
International Scanning Probe Microscopy Conference (ISPM 2016), Grindelwald, Switzerland, June 12-15, 2016
Organisational unit
03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)  
Notes
Poster presentation. Extracts of printed abstract booklet available from astemmer@ethz.ch.
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