Non-invasive voltage measurement in a three-phase autonomous meter
dc.contributor.author
Brunelli, Davide
dc.contributor.author
Villani, Clemente
dc.contributor.author
Balsamo, Domenico
dc.contributor.author
Benini, Luca
dc.date.accessioned
2017-06-12T09:53:48Z
dc.date.available
2017-06-12T09:53:48Z
dc.date.issued
2016-07
dc.identifier.issn
0946-7076
dc.identifier.issn
1432-1858
dc.identifier.other
10.1007/s00542-016-2890-7
dc.identifier.uri
http://hdl.handle.net/20.500.11850/118870
dc.language.iso
en
dc.publisher
Springer
dc.title
Non-invasive voltage measurement in a three-phase autonomous meter
dc.type
Journal Article
ethz.journal.title
Microsystem technologies
ethz.journal.volume
22
ethz.journal.issue
7
ethz.journal.abbreviated
Microsyst. technol.
ethz.pages.start
1915
ethz.pages.end
1926
ethz.notes
Published online 12 April 2016.
ethz.identifier.wos
ethz.identifier.nebis
001472574
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.date.deposited
2017-06-12T09:56:48Z
ethz.source
ECIT
ethz.identifier.importid
imp593654957e55954174
ethz.ecitpid
pub:180855
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T19:04:07Z
ethz.rosetta.lastUpdated
2022-03-28T15:03:55Z
ethz.rosetta.versionExported
true
ethz.COinS
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