Film Thickness Measurement System using FPGA Technology

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Author
Riaño, Adriana B.
Bannwart, Antonio
Velasco, Hugo F.
Rodriguez, O.M.H.
Prasser, Horst-Michael
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Date
2015
Type
  • Conference Paper
Publication status
published
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Editor
Garcá Posada, Lorena
Vizcaya Guarín, Pedro
Book title
2015 20th Symposium on Signal Processing, Images and Computer Vision (STSIVA). Conference Proceedings
Publisher
IEEE
Event
20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015, Bogotá, Colombia, September 2-4, 2015
Notes
Published online 19 November 2016.
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