Film Thickness Measurement System using FPGA Technology - Research Collection

Metadata only

Author

Riaño, Adriana B.

Bannwart, Antonio

Velasco, Hugo F.

Rodriguez, O.M.H.

Prasser, Horst-Michael

Date

2015

Type

Conference Paper

Citations

Cited 1 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/STSIVA.2015.7330426

Editor

Garcá Posada, Lorena

Vizcaya Guarín, Pedro

Book title

2015 20th Symposium on Signal Processing, Images and Computer Vision (STSIVA). Conference Proceedings

Publisher

IEEE

Event

20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015, Bogotá, Colombia, September 2-4, 2015

Notes

Published online 19 November 2016.

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Citations

Cited 1 times in Web of Science

ETH Bibliography

yes

Altmetrics