Header
Upper Right Menu
Log in
de
Research Collection
Toggle navigation
Upper Right Menu
Login
Help
Help
Language
Deutsch
Toggle navigation
Search
View Item
Home
Conference Contributions
Conference Paper
View Item
Home
Conference Contributions
Conference Paper
View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Research Collection
Navigational link
Search
Film Thickness Measurement System using FPGA Technology
Mendeley
CSV
RIS
BibTeX
Metadata only
Author
Riaño, Adriana B.
Bannwart, Antonio
Velasco, Hugo F.
Rodriguez, O.M.H.
Prasser, Horst-Michael
Show all
Date
2015
Type
Conference Paper
Citations
Cited 1 times in
Web of Science
ETH Bibliography
yes
Altmetrics
Publication status
published
External links
https://doi.org/10.1109/STSIVA.2015.7330426
Editor
Garcá Posada, Lorena
Vizcaya Guarín, Pedro
Book title
2015 20th Symposium on Signal Processing, Images and Computer Vision (STSIVA). Conference Proceedings
Publisher
IEEE
Event
20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015
,
Bogotá, Colombia
,
September 2-4, 2015
Notes
Published online 19 November 2016.
More
Show all metadata
Citations
Cited 1 times in
Web of Science
ETH Bibliography
yes
Altmetrics
Browse
Organisational Units
Publication Types
Authors
Publish
New Submission
Statistics
Downloads by Country
Most Popular Items
Most Popular Authors