Film Thickness Measurement System using FPGA Technology - Research Collection

Metadata only

Autor(in)

Riaño, Adriana B.

Bannwart, Antonio

Velasco, Hugo F.

Rodriguez, O.M.H.

Prasser, Horst-Michael

Datum

2015

Typ

Conference Paper

Zitate

1 Zitate in Web of Science

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

https://doi.org/10.1109/STSIVA.2015.7330426

Herausgeber(in)

Garcá Posada, Lorena

Vizcaya Guarín, Pedro

Buchtitel

2015 20th Symposium on Signal Processing, Images and Computer Vision (STSIVA). Conference Proceedings

Verlag

IEEE

Konferenz

20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015, Bogotá, Colombia, September 2-4, 2015

Anmerkungen

Published online 19 November 2016.

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Zitate

1 Zitate in Web of Science

ETH Bibliographie

yes

Altmetrics