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dc.contributor.author
Riaño, Adriana B.
dc.contributor.author
Bannwart, Antonio
dc.contributor.author
Velasco, Hugo F.
dc.contributor.author
Rodriguez, O.M.H.
dc.contributor.author
Prasser, Horst-Michael
dc.contributor.editor
Garcá Posada, Lorena
dc.contributor.editor
Vizcaya Guarín, Pedro
dc.date.accessioned
2017-06-12T10:36:29Z
dc.date.available
2017-06-12T10:36:29Z
dc.date.issued
2015
dc.identifier.isbn
978-1-4673-9461-1
dc.identifier.other
10.1109/STSIVA.2015.7330426
dc.identifier.uri
http://hdl.handle.net/20.500.11850/119276
dc.language.iso
en
dc.publisher
IEEE
dc.title
Film Thickness Measurement System using FPGA Technology
dc.type
Conference Paper
ethz.book.title
2015 20th Symposium on Signal Processing, Images and Computer Vision (STSIVA). Conference Proceedings
ethz.size
7 p.
ethz.event
20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015
ethz.event.location
Bogotá, Colombia
ethz.event.date
September 2-4, 2015
ethz.notes
Published online 19 November 2016.
ethz.identifier.wos
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.date.deposited
2017-06-12T10:38:39Z
ethz.source
ECIT
ethz.identifier.importid
imp5936549db295718605
ethz.ecitpid
pub:181282
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-17T09:59:27Z
ethz.rosetta.lastUpdated
2017-07-17T09:59:27Z
ethz.rosetta.versionExported
true
ethz.COinS
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