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dc.contributor.author
Sant, Saurabh
dc.contributor.author
Schenk, Andreas
dc.contributor.author
Moselund, Kirsten
dc.contributor.author
Riel, Heike
dc.date.accessioned
2017-06-12T12:52:31Z
dc.date.available
2017-06-12T12:52:31Z
dc.date.issued
2016
dc.identifier.isbn
978-1-5090-2827-6
dc.identifier.other
10.1109/DRC.2016.7548413
dc.identifier.uri
http://hdl.handle.net/20.500.11850/120737
dc.language.iso
en
dc.publisher
IEEE
dc.title
Impact of trap-assisted tunneling and channel quantization on InAs/Si hetero Tunnel FETs
dc.type
Conference Paper
ethz.book.title
74th Annual Device Research Conference (DRC 2016)
ethz.pages.start
7548413
ethz.size
2 p.
ethz.event
74th Annual Device Research Conference (DRC 2016)
ethz.event.location
Newark, DE, USA
ethz.event.date
June 19-22, 2016
ethz.notes
.
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.date.deposited
2017-06-12T12:55:11Z
ethz.source
ECIT
ethz.identifier.importid
imp593654b976f5d40714
ethz.ecitpid
pub:182813
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-25T10:51:15Z
ethz.rosetta.lastUpdated
2018-11-03T00:17:06Z
ethz.rosetta.versionExported
true
ethz.COinS
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