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dc.contributor.author
Ievlev, Anton V.
dc.contributor.author
Maksymovych, Petro
dc.contributor.author
Trassin, Morgan
dc.contributor.author
Seidel, Jan
dc.contributor.author
Ramesh, Ramamoorthy
dc.contributor.author
Kalinin, Sergei V.
dc.contributor.author
Ovchinnikova, Olga S.
dc.date.accessioned
2017-06-12T14:10:32Z
dc.date.available
2017-06-12T14:10:32Z
dc.date.issued
2016-11
dc.identifier.other
10.1021/acsami.6b10784
dc.identifier.uri
http://hdl.handle.net/20.500.11850/121478
dc.language.iso
en
dc.publisher
American Chemical Society
dc.subject
Ferroelectric thin film
dc.subject
Polarization switching
dc.subject
Atomic force microscopy
dc.subject
Time-of-flight secondary ion mass spectrometry
dc.subject
Chemical phenomena
dc.subject
Ion intermixing
dc.title
Chemical State Evolution in Ferroelectric Films during Tip-Induced Polarization and Electroresistive Switching
dc.type
Journal Article
ethz.journal.title
ACS Applied Materials and Interfaces
ethz.journal.volume
8
ethz.journal.issue
43
ethz.pages.start
29588
ethz.pages.end
29593
ethz.notes
Published online 11 October 2016.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
005704910
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03918 - Fiebig, Manfred / Fiebig, Manfred
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03918 - Fiebig, Manfred / Fiebig, Manfred
ethz.date.deposited
2017-06-12T14:17:07Z
ethz.source
ECIT
ethz.identifier.importid
imp593654c76f29791310
ethz.ecitpid
pub:183581
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T04:22:08Z
ethz.rosetta.lastUpdated
2019-01-02T06:54:27Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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