SAR tomography as an add-on to PSI: Gain in deformation sampling vis-a-vis quality of the detected scatterers
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Date
2016Type
- Conference Paper
ETH Bibliography
yes
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Publication status
publishedExternal links
Book title
2016 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)Pages / Article No.
Publisher
IEEEEvent
Subject
SAR tomography; Persistent scatterer interferometry; Multi-baseline interferometry; TerraSAR-XOrganisational unit
03849 - Hajnsek, Irena / Hajnsek, Irena
08704 - SAR Remote Sensing Technology / SAR Remote Sensing Technology
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ETH Bibliography
yes
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