SAR tomography as an add-on to PSI: Gain in deformation sampling vis-a-vis quality of the detected scatterers

Metadata only

Autor(in)

Datum

2016

Typ

Conference Paper

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

Buchtitel

2016 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)

Seiten / Artikelnummer

1452 - 1455

Verlag

IEEE

Konferenz

36th IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2016), Beijing, China, July 10-15, 2016

Thema

SAR tomography; Persistent scatterer interferometry; Multi-baseline interferometry; TerraSAR-X

Organisationseinheit

03849 - Hajnsek, Irena / Hajnsek, Irena
08704 - SAR Remote Sensing Technology / SAR Remote Sensing Technology

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ETH Bibliographie

yes

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