Low temperature X-Ray powder diffraction study of lead telluride doped with Yb
- Journal Article
Journal / seriesJournal of Optoelectronics and Advanced Materials
Pages / Article No.
PublisherINOE & INFM
SubjectLattice constant; Lead telluride; X-ray diffraction; Linear thermal expansion coefficient
Organisational unit03401 - Steurer, Walter
NotesReceived February 25 2008, accepted April 2 2008.
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