Low temperature X-Ray powder diffraction study of lead telluride doped with Yb
Metadata only
Date
2008Type
- Journal Article
Publication status
publishedJournal / series
Journal of Optoelectronics and Advanced MaterialsVolume
Pages / Article No.
Publisher
INOE & INFMSubject
Lattice constant; Lead telluride; X-ray diffraction; Linear thermal expansion coefficientOrganisational unit
03401 - Steurer, Walter
Notes
Received February 25 2008, accepted April 2 2008.More
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