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dc.contributor.author
Nicorici, A.
dc.contributor.author
Shklover, V.
dc.contributor.author
Todosiciuc, A.
dc.date.accessioned
2017-06-08T20:32:19Z
dc.date.available
2017-06-08T20:32:19Z
dc.date.issued
2008
dc.identifier.issn
1454-4164
dc.identifier.uri
http://hdl.handle.net/20.500.11850/12202
dc.language.iso
en
dc.publisher
INOE & INFM
dc.subject
Lattice constant
dc.subject
Lead telluride
dc.subject
X-ray diffraction
dc.subject
Linear thermal expansion coefficient
dc.title
Low temperature X-Ray powder diffraction study of lead telluride doped with Yb
dc.type
Journal Article
ethz.journal.title
Journal of optoelectronics and advanced materials
ethz.journal.volume
10
ethz.journal.issue
4
ethz.pages.start
860
ethz.pages.end
861
ethz.notes
Received February 25 2008, accepted April 2 2008.
ethz.identifier.wos
ethz.publication.place
Bucharest
ethz.publication.status
published
ethz.leitzahl
03401 - Steurer, Walter
ethz.leitzahl.certified
03401 - Steurer, Walter
ethz.date.deposited
2017-06-08T20:32:31Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c12ef75319298
ethz.ecitpid
pub:23498
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T09:31:33Z
ethz.rosetta.lastUpdated
2017-11-01T08:19:41Z
ethz.rosetta.versionExported
true
ethz.COinS
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