Enabling Accurate and Practical Online Flash Channel Modeling for Modern MLC NAND Flash Memory - Research Collection

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Author

Haratsch, Erich F.

Date

2016-09

Type

Journal Article

Citations

Cited 24 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/jsac.2016.2603608

Journal / series

IEEE Journal on Selected Areas in Communications

Volume

34(9)

Pages / Article No.

2294 - 2311

Publisher

IEEE

Subject

Fault tolerance; Flash memory; Memory reliability; Modeling; Solid state drives; Threshold voltage distribution

Organisational unit

09483 - Mutlu, Onur / Mutlu, Onur

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Show all metadata

Citations

Cited 24 times in Web of Science

ETH Bibliography

yes

Altmetrics