Physical modeling of ferroelectric field-effect transistors in the negative capacitance regime - Research Collection

Metadata only

Author

Lenarczyk, Pawel

Luisier, Mathieu

Date

2016

Type

Conference Paper

Citations

Cited 14 times in Web of Science

Cited 14 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/SISPAD.2016.7605209

Editor

Book title

2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Pages / Article No.

311 - 314

Publisher

IEEE

Event

International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Germany, September 6-8, 2016

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu

More

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Citations

Cited 14 times in Web of Science

Cited 14 times in Scopus

ETH Bibliography

yes

Altmetrics