Physical modeling of ferroelectric field-effect transistors in the negative capacitance regime
dc.contributor.author
Lenarczyk, Pawel
dc.contributor.author
Luisier, Mathieu
dc.contributor.editor
Bär, E.
dc.contributor.editor
Lorenz, J.
dc.contributor.editor
Pichler, P.
dc.date.accessioned
2017-06-12T15:50:22Z
dc.date.available
2017-06-12T15:50:22Z
dc.date.issued
2016
dc.identifier.isbn
978-1-5090-0818-6
dc.identifier.isbn
978-1-5090-0816-2
dc.identifier.isbn
978-1-5090-0819-3
dc.identifier.isbn
978-1-5090-0817-9
dc.identifier.other
10.1109/SISPAD.2016.7605209
dc.identifier.uri
http://hdl.handle.net/20.500.11850/122578
dc.language.iso
en
dc.publisher
IEEE
dc.title
Physical modeling of ferroelectric field-effect transistors in the negative capacitance regime
dc.type
Conference Paper
ethz.book.title
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
ethz.pages.start
311
ethz.pages.end
314
ethz.event
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
ethz.event.location
Nürnberg, Germany
ethz.event.date
September 6-8, 2016
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.date.deposited
2017-06-12T15:55:48Z
ethz.source
ECIT
ethz.identifier.importid
imp593654dd3e3a039730
ethz.ecitpid
pub:184900
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T03:25:14Z
ethz.rosetta.lastUpdated
2018-11-03T00:40:37Z
ethz.rosetta.versionExported
true
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