Modeling the Thermal Conductivity of Si Nanowires with Surface Roughness
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Date
2016Type
- Conference Paper
Publication status
publishedExternal links
Editor
Book title
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)Pages / Article No.
Publisher
IEEEEvent
Subject
Thermoelectricity; Thermal conductivity; Phonon surface roughness; Device modelingOrganisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu
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