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dc.contributor.author
Vuttivorakulchai, Kantawong
dc.contributor.author
Luisier, Mathieu
dc.contributor.author
Schenk, Andreas
dc.contributor.editor
Bär, E.
dc.contributor.editor
Lorenz, J.
dc.contributor.editor
Pichler, P.
dc.date.accessioned
2017-06-12T15:50:42Z
dc.date.available
2017-06-12T15:50:42Z
dc.date.issued
2016
dc.identifier.isbn
978-1-5090-0818-6
dc.identifier.isbn
978-1-5090-0816-2
dc.identifier.isbn
978-1-5090-0819-3
dc.identifier.isbn
978-1-5090-0817-9
dc.identifier.other
10.1109/SISPAD.2016.7605138
dc.identifier.uri
http://hdl.handle.net/20.500.11850/122582
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Thermoelectricity
dc.subject
Thermal conductivity
dc.subject
Phonon surface roughness
dc.subject
Device modeling
dc.title
Modeling the Thermal Conductivity of Si Nanowires with Surface Roughness
dc.type
Conference Paper
ethz.book.title
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
ethz.pages.start
19
ethz.pages.end
22
ethz.event
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
ethz.event.location
Nürnberg, Germany
ethz.event.date
September 6-8, 2016
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.date.deposited
2017-06-12T15:55:48Z
ethz.source
ECIT
ethz.identifier.importid
imp593654dd47e3014389
ethz.ecitpid
pub:184904
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T14:36:51Z
ethz.rosetta.lastUpdated
2018-11-03T00:40:42Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Modeling%20the%20Thermal%20Conductivity%20of%20Si%20Nanowires%20with%20Surface%20Roughness&rft.date=2016&rft.spage=19&rft.epage=22&rft.au=Vuttivorakulchai,%20Kantawong&Luisier,%20Mathieu&Schenk,%20Andreas&rft.isbn=978-1-5090-0818-6&978-1-5090-0816-2&978-1-5090-0819-3&978-1-5090-0817-9&rft.genre=proceeding&rft_id=info:doi/978-1-5090-0818-6&info:doi/978-1-5090-0816-2&info:doi/978-1-5090-0819-3&info:doi/978-1-5090-0817-9&rft.btitle=2016%20International%20Conference%20on%20Simulation%20of%20Semiconductor%20Processes%20and%20Devices%20(SISPAD)
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