Effect of Surface Roughness and Phonon Scattering on Extremely Narrow InAs-Si Nanowire TFETs

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Author
Carrillo Núñez, Hamilton
Rhyner, Reto
Luisier, Mathieu
Schenk, Andreas
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Date
2016
Type
  • Conference Paper
Publication status
published
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Book title
2016 46th European Solid-State Device Research Conference (ESSDERC)
Pages
188 - 191
Publisher
IEEE
Event
46th European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland, September 12-15, 2016
Organisational unit
03925 - Luisier, Mathieu
Notes
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