Effect of Surface Roughness and Phonon Scattering on Extremely Narrow InAs-Si Nanowire TFETs

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Author

Carrillo Núñez, Hamilton

Rhyner, Reto

Luisier, Mathieu

Schenk, Andreas

Date

2016

Type

Citations

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Publication status

published

External links

Book title

2016 46th European Solid-State Device Research Conference (ESSDERC)

Pages

188 - 191

Publisher

IEEE

Event

46th European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland, September 12-15, 2016

Organisational unit

03925 - Luisier, Mathieu

Notes

.

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