Effect of Surface Roughness and Phonon Scattering on Extremely Narrow InAs-Si Nanowire TFETs
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Date
2016Type
- Conference Paper
Publication status
publishedExternal links
Book title
2016 46th European Solid-State Device Research Conference (ESSDERC)Pages / Article No.
Publisher
IEEEEvent
Organisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu
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