Effect of Surface Roughness and Phonon Scattering on Extremely Narrow InAs-Si Nanowire TFETs

Thumbnail
Metadata only
Author
Carrillo Núñez, Hamilton
Rhyner, Reto
Luisier, Mathieu
Schenk, Andreas
Show all
Date
2016
Type
  • Conference Paper
Publication status
published
External links
Search via SFX
Book title
2016 46th European Solid-State Device Research Conference (ESSDERC)
Pages / Article No.
188 - 191
Publisher
IEEE
Event
46th European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland, September 12-15, 2016
Organisational unit
03925 - Luisier, Mathieu  
Notes
.
More
Show all metadata
ETH Bibliography
yes
Altmetrics