Effect of Surface Roughness and Phonon Scattering on Extremely Narrow InAs-Si Nanowire TFETs - Research Collection

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Author

Carrillo Núñez, Hamilton

Rhyner, Reto

Luisier, Mathieu

Schenk, Andreas

Date

2016

Type

Conference Paper

Citations

Cited 3 times in Scopus

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

https://doi.org/10.1109/ESSDERC.2016.7599618

Book title

2016 46th European Solid-State Device Research Conference (ESSDERC)

Pages / Article No.

188 - 191

Publisher

IEEE

Event

46th European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland, September 12-15, 2016

Organisational unit

03925 - Luisier, Mathieu

Notes

.

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Show all metadata

Citations

Cited 3 times in Scopus

ETH Bibliography

yes

Altmetrics