Effect of Surface Roughness and Phonon Scattering on Extremely Narrow InAs-Si Nanowire TFETs - Research Collection

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Autor(in)

Carrillo Núñez, Hamilton

Luisier, Mathieu

Schenk, Andreas

Datum

2016

Typ

Conference Paper

Zitate

8 Zitate in Web of Science

8 Zitate in Scopus

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

https://doi.org/10.1109/ESSDERC.2016.7599618

Buchtitel

2016 46th European Solid-State Device Research Conference (ESSDERC)

Seiten / Artikelnummer

188 - 191

Verlag

IEEE

Konferenz

46th European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland, September 12-15, 2016

Organisationseinheit

03925 - Luisier, Mathieu / Luisier, Mathieu

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Zitate

8 Zitate in Web of Science

8 Zitate in Scopus

ETH Bibliographie

yes

Altmetrics