Performance Study of Strained III-V Materials for Ultra-Thin Body Transistor Applications
Publication status
publishedBook title
2016 46th European Solid-State Device Research Conference (ESSDERC)Pages / Article No.
Publisher
IEEEEvent
Subject
III-V semiconductors; Strain engineering; Density Functional Theory; Tight-binding; k.p; Ultra-Thin Body MOSFET; Dand structure; Top-of-the-barrier modelOrganisational unit
03925 - Luisier, Mathieu / Luisier, Mathieu
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