In situ characterization of block copolymer ordering on chemically nanopatterned surfaces by time-resolved small angle x-ray scattering
Stuen, K. O.
Welander, A. M.
Pablo, J. J. de
Nealey, P. F.
Satapathy, D. K.
Solak, H. H.
Veen, Johannes F. van der
- Conference Paper
Journal / seriesJournal of Vacuum Science and Technology B
PublisherAmerican Institute of Physics
Subjectannealing; nanopatterning; polymer blends; polymer films; scanning electron microscopy; surface chemistry; X-ray scattering
Organisational unit03562 - Van der Veen, Johannes
NotesReceived 7 June 2008, Accepted 2 September 2008, Published 1 December 2008.
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