Imaging of cell-to-material interfaces by SEM after in situ focused ion beam milling on flat surfaces and complex 3D-fibrous structures
Bittermann, Anne Greet
- Journal Article
Journal / seriesAdvanced engineering materials
Subjectcell-to-substrate interface; critical point-dried cells for FIB/SEM; FIB-milling on biological samples; in situ FIB-milling
Organisational unit03640 - Vogel, Viola
NotesReceived 7 March 2009, Revised 4 May 2009, Published online 30 September 2009.
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