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dc.contributor.author
Schindler, Konrad
dc.contributor.author
Suter, David
dc.date.accessioned
2017-06-08T20:36:26Z
dc.date.available
2017-06-08T20:36:26Z
dc.date.issued
2008
dc.identifier.issn
0031-3203
dc.identifier.issn
1873-5142
dc.identifier.other
10.1016/j.patcog.2008.05.025
dc.identifier.uri
http://hdl.handle.net/20.500.11850/12382
dc.language.iso
en
dc.publisher
Pergamon
dc.subject
Contour matching
dc.subject
Object category detection
dc.subject
Probabilistic shape distance
dc.subject
Region grouping
dc.title
Object Detection by Global Contour Shape
dc.type
Journal Article
ethz.journal.title
Pattern Recognition
ethz.journal.volume
41
ethz.journal.issue
12
ethz.journal.abbreviated
Pattern recogn.
ethz.pages.start
3736
ethz.pages.end
3748
ethz.notes
Received 16 July 2007, Received in revised form 15 May 2008, Accepted 26 May 2008.
ethz.identifier.nebis
000052230
ethz.publication.place
New York
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
ethz.date.deposited
2017-06-08T20:36:43Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c16701c165131
ethz.ecitpid
pub:23689
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T04:33:10Z
ethz.rosetta.lastUpdated
2018-10-01T06:22:52Z
ethz.rosetta.versionExported
true
ethz.COinS
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