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dc.contributor.author
Best, James P.
dc.contributor.author
Zechner, Johannes
dc.contributor.author
Wheeler, Jeffrey M.
dc.contributor.author
Schoeppner, Rachel
dc.contributor.author
Morstein, Marcus
dc.contributor.author
Michler, Johann
dc.date.accessioned
2017-06-12T17:22:42Z
dc.date.available
2017-06-12T17:22:42Z
dc.date.issued
2016
dc.identifier.issn
1478-6435
dc.identifier.issn
1478-6443
dc.identifier.other
10.1080/14786435.2016.1223891
dc.identifier.uri
http://hdl.handle.net/20.500.11850/124263
dc.language.iso
en
dc.publisher
Taylor & Francis
dc.subject
Fracture toughness
dc.subject
Notch
dc.subject
Ion-damage
dc.subject
Micro-mechanics
dc.subject
Ceramic thin films
dc.title
Small-scale fracture toughness of ceramic thin films: The effects of specimen geometry, ion beam notching and high temperature on chromium nitride toughness evaluation
dc.type
Journal Article
ethz.journal.title
Philosophical magazine
ethz.journal.volume
96
ethz.journal.issue
32-34
ethz.journal.abbreviated
Philos. mag. (2003, Print)
ethz.pages.start
3552
ethz.pages.end
3569
ethz.notes
Published online 25 August 2016.
ethz.identifier.wos
ethz.identifier.nebis
004476158
ethz.publication.place
Abingdon
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.date.deposited
2017-06-12T17:23:24Z
ethz.source
ECIT
ethz.identifier.importid
imp593654fa5bfc970488
ethz.ecitpid
pub:186732
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T14:17:10Z
ethz.rosetta.lastUpdated
2018-11-03T01:02:01Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Small-scale%20fracture%20toughness%20of%20ceramic%20thin%20films:%20The%20effects%20of%20specimen%20geometry,%20ion%20beam%20notching%20and%20high%20temperature%20on%20c&rft.jtitle=Philosophical%20magazine&rft.date=2016&rft.volume=96&rft.issue=32-34&rft.spage=3552&rft.epage=3569&rft.issn=1478-6435&1478-6443&rft.au=Best,%20James%20P.&Zechner,%20Johannes&Wheeler,%20Jeffrey%20M.&Schoeppner,%20Rachel&Morstein,%20Marcus&rft.genre=article&
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