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dc.contributor.author
Ammari, Habib
dc.contributor.author
Widlak, T.
dc.contributor.author
Zhang, W.
dc.date.accessioned
2017-06-12T17:28:01Z
dc.date.available
2017-06-12T17:28:01Z
dc.date.issued
2017-03
dc.identifier.issn
0033-569X
dc.identifier.issn
1552-4485
dc.identifier.other
10.1090/qam/1449
dc.identifier.uri
http://hdl.handle.net/20.500.11850/124330
dc.language.iso
en
dc.publisher
Brown University, Division of Applied Mathematics
dc.title
Towards monitoring critical microscopic parameters for electropermeabilization
dc.type
Journal Article
ethz.journal.title
Quarterly of Applied Mathematics
ethz.journal.volume
75
ethz.journal.issue
1
ethz.pages.start
1
ethz.pages.end
17
ethz.notes
Published online 27 July 2016.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
000053333
ethz.publication.place
Providence, RI
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02000 - Dep. Mathematik / Dep. of Mathematics::02501 - Seminar für Angewandte Mathematik / Seminar for Applied Mathematics::09504 - Ammari, Habib / Ammari, Habib
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02000 - Dep. Mathematik / Dep. of Mathematics::02501 - Seminar für Angewandte Mathematik / Seminar for Applied Mathematics::09504 - Ammari, Habib / Ammari, Habib
ethz.date.deposited
2017-06-12T17:29:03Z
ethz.source
ECIT
ethz.identifier.importid
imp593654fbaf76c94646
ethz.ecitpid
pub:186806
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-24T09:18:38Z
ethz.rosetta.lastUpdated
2018-11-03T01:03:14Z
ethz.rosetta.versionExported
true
ethz.COinS
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