Witt, Julia D.S.
Cooper, Jos F.K.
Kinane, Christian J.
Curran, Peter J.
Bending, Simon J.
Heyderman, Laura J.
- Journal Article
Rights / licenseCreative Commons Attribution 4.0 International
We present a detailed structural and magnetic characterization of sputter deposited thin film erbium, determined by x-ray diffraction, transport measurements, magnetometry and neutron diffraction. This provides information on the onset and change of the magnetic state as a function of temperature and applied magnetic field. Many of the features of bulk material are reproduced. Also of interest is the identification of a conical magnetic state which repeats with a wavevector parallel to the c axis τc = 4/17 in units of the reciprocal lattice parameter c*, which is a state not observed in any other thin film or bulk measurements. The data from the various techniques are combined to construct magnetic field, temperature (H, T)–phase diagrams for the 200 nm-thick Er sample that serves as a foundation for future exploitation of this complex magnetic thin film system Show more
Journal / seriesScientific Reports
Pages / Article No.
PublisherNature Publishing Group
SubjectElectronic properties and materials; Ferromagnetism; Magnetic properties and materials
Organisational unit03997 - Heyderman, Laura / Heyderman, Laura
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