Continuous Runahead: Transparent Hardware Acceleration for Memory Intensive Workloads
dc.contributor.author
Hashemi, Milad
dc.contributor.author
Mutlu, Onur
dc.contributor.author
Patt, Yale N.
dc.date.accessioned
2017-06-12T17:43:32Z
dc.date.available
2017-06-12T17:43:32Z
dc.date.issued
2016
dc.identifier.isbn
978-1-5090-3508-3
dc.identifier.isbn
978-1-5090-3509-0
dc.identifier.other
10.1109/MICRO.2016.7783764
dc.identifier.uri
http://hdl.handle.net/20.500.11850/124641
dc.language.iso
en
dc.publisher
IEEE
dc.title
Continuous Runahead: Transparent Hardware Acceleration for Memory Intensive Workloads
dc.type
Conference Paper
ethz.book.title
2016 49th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)
ethz.pages.start
7783764
ethz.size
12 p.
ethz.event
49th International Symposium on Microarchitecture (MICRO)
ethz.event.location
Taipei, Taiwan
ethz.event.date
October 15-19, 2016
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.date.deposited
2017-06-12T17:44:21Z
ethz.source
ECIT
ethz.identifier.importid
imp59365501d2f2016228
ethz.ecitpid
pub:187162
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T23:29:53Z
ethz.rosetta.lastUpdated
2021-02-14T14:49:26Z
ethz.rosetta.versionExported
true
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