Microscale Fracture Behavior of Single Crystal Silicon Beams at Elevated Temperatures

Jaya, Balila N.; Wheeler, Jeffrey M.; Wehrs, Juri; Best, James P.; Soler, Rafael; Michler, Johann; Kirchlechner, Christoph; Dehm, Gerhard

doi:10.1021/acs.nanolett.6b03461

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Author

Kirchlechner, Christoph

Dehm, Gerhard

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Date

2016-12

Type

Journal Article

Citations

Cited 44 times in Web of Science

Cited 45 times in Scopus

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yes

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Publication status

published

External links

https://doi.org/10.1021/acs.nanolett.6b03461

Journal / series

Nano Letters

Volume

16(12)

Pages / Article No.

7597 - 7603

Publisher

American Chemical Society

Subject

Microscale fracture; Brittle-to-ductile transition; Fracture toughness; Single crystal silicon

Organisational unit

03692 - Spolenak, Ralph / Spolenak, Ralph

Notes

Published online 2 November 2016.

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Show all metadata

Citations

Cited 44 times in Web of Science

Cited 45 times in Scopus

ETH Bibliography

yes

Altmetrics

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