Performance predictions of single-layer InV double-gate n- and p-type field-effect transistors - Research Collection

Metadata only

Author

Carrillo-Nuñez, Hamilton

Stieger, Christian

Luisier, Mathieu

Schenk, Andreas

Date

2016

Type

Conference Paper

Citations

Cited 1 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/IEDM.2016.7838417

Book title

2016 IEEE International Electron Devices Meeting (IEDM)

Pages / Article No.

14.5.1 - 14.5.4

Publisher

IEEE

Event

IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, December 3-7, 2016

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu

Notes

Also published by: http://dx.doi.org/10.3929/ethz-a-010810577.

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Citations

Cited 1 times in Scopus

ETH Bibliography

yes

Altmetrics