Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
Publication status
publishedPublisher
ETH ZürichSubject
Matlab; NanoLib; STM; SFMOrganisational unit
03351 - Pescia, Danilo (emeritus) / Pescia, Danilo (emeritus)
Notes
This package contains the evaluation scripts to reproduce the analysis and figures presented in the paper.. Research Dataset. Supplementary Material.More
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