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dc.contributor.editor
Ciappa, Mauro
dc.contributor.editor
Iannuzzo, Francesco
dc.date.accessioned
2017-10-18T14:28:36Z
dc.date.available
2017-06-12T19:11:16Z
dc.date.available
2017-10-18T14:28:36Z
dc.date.issued
2016-03
dc.identifier.issn
0026-2714
dc.identifier.issn
1872-941X
dc.identifier.other
10.1016/j.microrel.2016.01.0
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/127162
dc.language.iso
en
en_US
dc.publisher
Elsevier
en_US
dc.title
Reliability Issues in Power Electronics
en_US
dc.type
Journal Issue
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
58
en_US
ethz.journal.issue
SI
en_US
ethz.journal.abbreviated
Microelectron. reliab.
ethz.pages.start
1
ethz.pages.end
210
ethz.notes
Special Issue of Microelectronic Reliability.
en_US
ethz.identifier.nebis
001933457
ethz.publication.place
Kidlington, Oxford
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
en_US
ethz.identifier.url
http://www.sciencedirect.com/science/journal/00262714/58
ethz.date.deposited
2017-06-12T19:11:22Z
ethz.source
ECIT
ethz.identifier.importid
imp5936552b7692e25676
ethz.ecitpid
pub:189979
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-12T23:39:53Z
ethz.rosetta.lastUpdated
2018-11-05T22:26:18Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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